2003 Design, Automation and Test in Europe Conference and Exposition

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating systems for SoC, design methodologies, and analog and mixed signal methodology design. The topics in v.2 include ambient intelligence vision, energy-efficient memory systems, jitter and noise analysis for analog systems, uncertainty, architectural level synthesis, and delay testing and diagnosis. Annotation (c) Book News, Inc., Portland, OR (booknews.com)