Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices) , particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.- Contains contributions from leading authorities on the subject matter- Informs and updates on the latest developments in the field of imaging and electron physics- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource- Features extended articles on the physics of electron devices (especially semiconductor devices) , particle optics at high and low energies, microlithography, image science and digital image processing